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Pacific Nanotechnology Products

Nano-Rp™
The Nano-Rp™ SPM is optimized for research and development on nanoparticles applications. It may be purchased with both the light lever AFM scanner and the crystal scanner
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	Nano R2™
	Nano-R2™ is a state of the art atomic force microscope with motorized stage control complementary high-resolution optics and close loop scanner
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Nano Flat
NanoFlat substrates are ready to use substrates for nanoparticle visualisation with AFM ,covers wide range of particle sizes and applications
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	Particle Characterization : Outline , Count , Measure
	Outline, count, Measure - NanoRule+™ particle characterization software provides most efficient way to charecterize AFM nanoparticle data
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NanoRule+™
Nano Rule ,powerful image display and analysis software is essential for viewing and analysing the image from an Atomic Force Microscope
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	Particle Reference sample
	The PNI particle reference sample is designed for AFM visualization of monodispersed polymer spheres. Nominal diameter of spheres is 100 nm, calibrated with TEM and AFM. The sample is used for establishing measurement methodologies as well as instrument/probe calibration.
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Particle Training
This two day training course is intended to help PNI customers learn what is required to scan and analyze nanoparticles with the Nano-Rp™ SPM. The training includes classroom discussions and hands on operation of the Nano-Rp™ SPM.
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